Hiden Analytical Limited

http://www.HidenAnalytical.com
+44 (0) 1925 445 225

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About Hiden Analytical Limited

For 30 years Hiden Analytical has been a global leader in the design and manufacture of scientific instruments for research, development and production applications.

In vacuum, gas, surface and plasma processes our quadrupole mass spectrometers have gained worldwide recognition for their precision and outstanding performance. Our range of instruments offer state-of-the-art solutions in the measurement of process and environmental gas sampling.

With sales and service centres situated across the globe, Hiden Analytical is committed to providing a fast, friendly and professional response, through our teams of application specialists, wherever our customers are located.

As a privately owned company we have built our reputation on creating close, positive relationships with our customers. Many of these customers are working at the forefront of new technology, in particular the fields of plasma research and surface science studies. To maintain this reputation we have, over the years, established within our company, exceptional levels of technical expertise in these areas. Our commitment to both new and existing customers is to provide systems that, of course, meet specification, but further, enable the advancement of their work, whether it be pure research or the improvement/monitoring of products/process performance.

We have a common vision, not only to supply instruments and systems with first class performance specifications, long term reliability and professional service support, but also, and in many cases more importantly, to maintain close contact to ensure that our systems provide all that our customers expect, and more, from their “investment” in our organisation.

What We Do

Hiden Analytical manufactures quadrupole mass spectrometers

Our quadrupole mass spectrometers are available in a broad range of configurations for gas / vapour analysis, residual gas analysis, plasma ion analysis, UHV surface science , thermal analysis and surface analysis. Hiden mass spectrometers are configured for mass ranges:100, 200, 300, 510, 1000, 2500 and 5000 AMU, providing for analysis of the widest variety of volatile organic, metal organic and inorganic compounds. Hiden mass spectrometer control software provides for fast real time data acquisition over 10 decades dynamic range.
Our bespoke design service provides for client interactive development of solutions to meet specific requirements.

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About Hiden Analytical Limited

Mass spectrometers for gas analysis

Real time gas analysers that address the broadest application range

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Quantitative gas analyser
HPR-20 R&D Specialist gas analysis system for advanced research
HPR-20 EGA Gas analysis system for evolved gas analysis in TGA-MS
TGA-MS Mass spectrometer inlets for connecting/coupling to TGA systems
QIC Series Inlets Hiden offer a variety of inlet options for the QIC Series gas analysis systems
HPR-20 TMS Transient mass spectrometer for fast event gas analysis
QIC Biostream Multi-stream gas/vapour analyser for fermentation off-gas analysis
QIC Multistream Integrated MS and selector valve for multi-component, multi-stream gas analysis
HPR-40 DSA Membrane inlet mass spectrometer for dissolved species analysis
HPR-40 DEMS Solutions for dissolved gas analysis and off-gas analysis in electrochemistry
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis
HPR-70 Batch inlet gas analysis system for discrete low volume sample analysis
HPR-90 Automated package cracking analysis system for light bulb gas analysis
Compact Gas Analysers For less demanding applications

 

Mass spectrometers for catalysis and thermal analysis

Automated micro reactors and mass spectrometers for catalyst researchers

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TLAB-PCS Automated microreactor/mass spectrometer system
CATLAB-FB Horizontal Furnace/MS System for Catalyst Core Quantification
SpaciMS Spatially resolved capillary inlet mass spectrometer
TPD Workstation For UHV temperature programmed desorption studies
HPR-20 TMS Transient mass spectrometer for fast event studies
TGA-MS Mass spectrometer inlets for connecting/coupling to TGA systems
3F-PIC Transient mass spectrometer for fast event UHV studies
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis

 

Mass spectrometers for thin films, plasma and surface engineering

RGA, plasma ion analysis, surface analysis and SIMS end point detection

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HPR-30 Process and residual gas analysis
EQP Analysis of positive and negative ions, neutrals, and radicals
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis
PSM Plasma sampling mass spectrometer
ESPion Langmuir probe for measurement of plasma properties
IMP-EPD For ion etch control and optimum process quality
XBS MBE deposition flux rate monitor
TPD Workstation For UHV temperature programmed desorption studies
SIMS Workstation UHV SIMS instrument for thin film surface analysis, static SIMS, depth profiling, and imaging
Compact SIMS Compact SIMS instrument optimised for depth profiling at the nanometer scale
AutoSIMS Automatic Surface Analysis System
EQS SIMS Analyser Bolt-on SIMS analyser for the analysis of secondary ve and -ve ions from solid samples
MAXIM SIMS/SNMS analyser for static and dynamic SIMS and SNMS
IG5C A 5KeV Caesium SIMS primary ion source for UHV surface analysis
IG20 A 5KeV Argon or Oxygen SIMS primary ion source for UHV surface analysis

 

Mass spectrometers for residual gas analysis

Analysis of gas and vapour species in vacuum chambers and processes

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A Series For the examination of components present in a vessel or evolved from a process
Ion Source Options A range of electron impact ion sources that can be supplied with any of our RGAs
HMT A dual mode RGA system for vacuum diagnostics and process monitoring
HAL 201 RC A Residual Gas Analyser configured for demanding UHV applications
HALO 201 MBE For molecular beam epitaxy applications
XBS An MBE deposition flux rate monitor
qRGA For tokamak/torus fusion research
3F Series 1000 RGA For high precision scientific and process applications
DLS-20 Ultra High Resolution Quadrupole Mass Spectrometer
3F-PIC Transient mass spectrometer for fast event UHV studies
EPIC A system for UHV analysis of neutrals, radicals and ions
IDP A system for analysis of ions, neutrals and radicals in UHV desorption studies

 

Mass spectrometers for surface analysis

Surface analysis, UHV surface analysis, SIMS & SNMS

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AutoSIMS Automatic Surface Analysis System
SIMS Workstation UHV SIMS instrument for thin film surface analysis, static SIMS, depth profiling, and imaging
Compact SIMS Compact SIMS instrument optimised for depth profiling at the nanometer scale
EQS SIMS Analyser Bolt-on SIMS analyser for the analysis of secondary ve and -ve ions from solid samples
MAXIM SIMS/SNMS analyser for static and dynamic SIMS and SNMS
IG5C A 5KeV Caesium SIMS primary ion source for UHV surface analysis
IG20 A 5KeV Argon or Oxygen SIMS primary ion source for UHV surface analysis

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Pharmaceutical Product Development

Real time analysis of organic vapours and moisture in reactions

HPR-20 R&D Plus System with integrated gas control calibration unit
CATLAB-PCS Automated microreactor/mass spectrometer system
QIC Biostream Multi-stream gas/vapour analyser for fermentation off-gas analysis
QGA Quantitative gas analyser
HPR-40 DSA Membrane inlet mass spectrometer for dissolved species analysis
HPR-30 Process and residual gas analysis

Semiconductor Production and Research

Process monitoring for advanced manufacturing processes

RGA Series For the examination of components present in a vessel or evolved from a process
HPR-30 Process and residual gas analysis
HMT A dual mode RGA system for vacuum diagnostics and process monitoring
IMP-EPD For ion etch control and optimum process quality
TPD Workstation A system for UHV temperature programmed desorption (TPD/TDS) studies
SIMS Workstation A UHV surface analysis system for thin film depth profiling
EQP Analysis of positive and negative ions, neutrals, and radicals
ESPion For measurement of plasma properties
PSM Plasma sampling mass spectrometer
XBS A system for multiple source monitoring in MBE deposition applications

Mass Spectrometers in the Chemical Industry

R&D and process monitoring for gas/vapour analysis

HPR-40 DSA Membrane inlet mass spectrometer for dissolved species analysis
QGA Quantitative gas analyser
HPR-20 R&D Specialist gas analysis system for advanced research
HPR-20 TMS A specialist gas analysis system for fast event transient analysis
QIC Biostream Multi-stream gas/vapour analyser for fermentation off-gas analysis

Mass Spectrometers for the Automotive Industry

Exhaust gas emissions, fuel cell technology, catalysts

CATLAB-PCS Automated microreactor/mass spectrometer system
SpaciMS Spatially resolved capillary inlet mass spectrometer
HPR-20 R&D Specialist gas analysis system for advanced research
QGA Quantitative gas analyser

Aerospace and the Quadrupole Mass Spectrometer

Development of special materials, hard coatings and metallurgical films

HMT A dual mode RGA system for vacuum diagnostics and process monitoring
3F Series 1000/2000 RGA For high precision scientific and process applications
HPR-30 Process and residual gas analysis
EQP Analysis of positive and negative ions, neutrals, and radicals
ESPion For measurement of plasma properties
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis
PSM Plasma sampling mass spectrometer
EQS For the analysis of secondary +ve and -ve ions from solid samples
SIMS Workstation For thin film depth profiling
EPIC A system for UHV analysis of neutrals, radicals and ions
IDP A system for analysis of ions, neutrals and radicals in UHV desorption studies
TPD Workstation For UHV temperature programmed desorption studies

Mass Spectrometers for the Foodstuffs Industry

Quadrupole mass spectrometry for the food industry

HPR-20 R&D Plus System with integrated gas control calibration unit
CATLAB-PCS Automated microreactor/mass spectrometer system
TPD Workstation For UHV temperature programmed desorption studies
QIC Biostream Multi-stream gas/vapour analyser for fermentation off-gas analysis
QGA Quantitative gas analyser
HPR-40 DSA Process and residual gas analysis

Mass Spectrometers for the Nuclear Industry

Quadrupole mass spectrometry for the nuclear industry

HPR-70 A system for discrete low volume sample analysis
QIC MultiStream An MS and selector valve system for multi-component, multi-stream gas analysis
qRGA A system for tokamak/torus fusion research
TPD Workstation For UHV temperature programmed desorption studies
SIMS Workstation For thin film depth profiling

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Gas Analysis

For real time analysis of gases and vapours

QGA A compact bench-top system for real time gas and vapour analysis
HPR-20 R&D A specialist gas analysis system for advanced research
HPR-20 EGA A compact bench-top gas analysis system for evolved gas analysis in TGA-MS
HPR-20 TMS A specialist gas analysis system for fast event transient analysis
QIC BioStream An integrated mass spectrometer for multi-stream, multi reactor fermentation off-gas analysis
QIC MultiStream An integrated mass spectrometer and selector valve system for multi-component, multi-stream gas analysis
HPR-40 DSA Design

 

Plasma Characterisation

Plasma characterisation, plasma ion analysers and langmuir probes

EQP Analysis of positive and negative ions, neutrals, and radicals
PSM Plasma sampling mass spectrometer
ESPion For measurement of plasma properties
HPR-60 MBMS Molecular bea

 

SIMS Surface Analysis and SNMS Surface Analysis

For the determination of surface composition, contaminant analysis and depth profiling

SIMS Workstation For thin film depth profiling
EQS For the analysis of secondary +ve and -ve ions from solid samples
MAXIM A system for static and dynamic SIMS and SNMS applications
IG5C A 5KeV Caesium ion gun for UHV surface analysis
IG20 A 5KeV Argon or Oxygen ion source for UHV surface analysis
FIB-SIMS

 

FIB-SIMS for Nano-Scale Materials Analysis

Add high performance SIMS capability to your existing FIB system

FIB-SIMS Add high performance SIMS capability to your existing FIB system
EQS

 

UHV Surface Science

For direct information on gas uptake and for dissolved output rates

EQS For the analysis of secondary +ve and -ve ions from solid samples
SIMS Workstation For thin film depth profiling
EPIC A system for UHV analysis of neutrals, radicals and ions
3F Series 1000 RGA For high precision scientific and process applications
IDP A system for analysis of ions, neutrals and radicals in UHV desorption studies
TPD Workstation For UHV temperature programmed desorption studies

 

Catalysis

For the determination of surface composition, contaminant analysis and for depth profiling

CATLAB-PCS Automated microreactor/mass spectrometer system
SpaciMS Spatially resolved capillary inlet mass spectrometer
HPR-20 R&D Specialist gas analysis system for advanced research
HPR-20 EGA Gas analysis system for evolved gas analysis in TGA-MS
HPR-20 TMS Transient mass spectrometer for fast event gas analysis
3F-PIC Transient mass spectrometer for fast event UHV studies
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis

 

Thin Films and Surface Engineering

Plasma characterisation, plasma ion analysers and langmuir probes

HPR-30 Process and residual gas analysis
EQP Analysis of positive and negative ions, neutrals, and radicals
PSM Plasma sampling mass spectrometer
ESPion For measurement of plasma properties
TPD Workstation For UHV temperature programmed desorption studies
SIMS Workstation For thin film depth profiling
IMP-EPD For ion etch control and optimum process quality
XBS MBE deposition flux rate monitor
IG5C A 5KeV Caesium ion gun for UHV surface analysis
IG20 A 5KeV Argon or Oxygen ion source for UHV surface analysis
FIB-SIMS Add high performance SIMS capability to your existing FIB system

 

Residual Gas Analysis for Vacuum Processing

For process monitoring and leak detection

HPR-30 Process and residual gas analysis
HMT A dual mode RGA system for vacuum diagnostics and process monitoring
3F Series 1000 RGA For high precision scientific and process applications

 

Thermal Analysis Mass Spectrometer Systems

For evolved gas analysis as a function of time and temperature

CATLAB-PCS Automated microreactor/mass spectrometer system
TPD Workstation For UHV temperature programmed desorption studies
HPR-20 R&D Specialist gas analysis system for advanced research
QGA A compact bench-top system for real time gas and vapour analysis

 

Nanotechnology

For the determination of surface composition, contaminant analysis and for depth profiling

SIMS Workstation For thin film depth profiling
XBS MBE deposition flux rate monitor
TPD Workstation For UHV temperature programmed desorption studies
HPR-60 MBMS A system for analysis of neutrals, radicals and ions
FIB-SIMS Add high performance SIMS capability to your existing FIB system

Residual Gas Analysis

For routine, fast, wide dynamic range residual gas analysis

RGA Series Systems for the examination of components present in a vessel or evolved from a process
HMT A dual mode RGA system for vacuum diagnostics and process monitoring
3F Series 1000 RGA For high precision scientific and process applications
HPR-30 Process and residual gas analysis

Dissolved Species Analysis

For analysis of respiratory gases, hydrocarbons and sulphides

HPR-40 DSA Membrane inlet mass spectrometer for dissolved species analysis

Molecular Beam Studies

For molecular beam analysis

3F Series 1000 RGA For high precision scientific and process applications
EPIC A system for UHV analysis of neutrals, radicals and ions
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis

Cluster Studies

Analysis of Clusters, Nanoscale Particles

EPIC A system for UHV analysis of neutrals, radicals and ions
HPR-60 MBMS Molecular beam sampling mass spectrometer for ion and radical analysis

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Local Support

SupportYour Local Support Centre

The recommended first contact for any questions about operation of your Hiden equipment is to send an email to: service@hiden.co.uk

Please include the WR number of your system in your email. Response to your application support questions and service emails is typically much less than one working day.

Phone Contact

Alternatively if you prefer to speak with us, please phone. At Hiden we do not use call centres, and typically you will be able to make direct personal contact with an experienced engineer to discuss any issues relating to your Hiden equipment.

Hiden Analytical | Warrington, UK +44 (0) 1925 445225
Hiden Analytical | Livonia, MI, USA [1] 734 542 6666
Hiden Analytical | La Jolla, CA, USA [1] 415 710 5069
Hiden Analytical | Naples, FL, USA [1] 734 716 2845
Hiden Analytical | Germany +49 (0)88 57 69301
Hiden Analytical | France +33 (0)6 11 81 22 87
Beijing Extratech Analytical Ltd | Beijing, China0086 135 0123 8067
Beijing Extratech Analytical Ltd | Shanghai, China0086 185 1633 7279
Innovation Science | Kawasaki, Kanagawa, Japan+81 (0)44 982 3152
Intech Analytics | Saint-Petersburg, Russia +7 (800) 200 24 80

To avoid disappointment please be aware of the local time zone and public holidays at the location of your Hiden contact.

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